Invention Grant
- Patent Title: Facility state monitoring system, analysis apparatus, method, and program
-
Application No.: US16961417Application Date: 2018-01-17
-
Publication No.: US11346867B2Publication Date: 2022-05-31
- Inventor: Shigeru Koumoto
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2018/001248 WO 20180117
- International Announcement: WO2019/142273 WO 20190725
- Main IPC: G01R19/25
- IPC: G01R19/25 ; G08C15/06

Abstract:
A measurement apparatus that measures a facility of a measurement target and that is able to transmit measurement data as intermittent data and an analysis apparatus. An analysis apparatus includes: a communication part that receives the intermittent data from the measurement apparatus; and an analysis part that estimates a standard data pattern serving as a reference, based on a common portion between a pair of the data in a set of the intermittent data received and determines presence of an anomaly for intermittent data of a determination target received from the measurement apparatus by referring to the standard data pattern.
Public/Granted literature
- US20200379020A1 FACILITY STATE MONITORING SYSTEM, ANALYSIS APPARATUS, METHOD, AND PROGRAM Public/Granted day:2020-12-03
Information query