• Patent Title: Facility state monitoring system, analysis apparatus, method, and program
  • Application No.: US16961417
    Application Date: 2018-01-17
  • Publication No.: US11346867B2
    Publication Date: 2022-05-31
  • Inventor: Shigeru Koumoto
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • International Application: PCT/JP2018/001248 WO 20180117
  • International Announcement: WO2019/142273 WO 20190725
  • Main IPC: G01R19/25
  • IPC: G01R19/25 G08C15/06
Facility state monitoring system, analysis apparatus, method, and program
Abstract:
A measurement apparatus that measures a facility of a measurement target and that is able to transmit measurement data as intermittent data and an analysis apparatus. An analysis apparatus includes: a communication part that receives the intermittent data from the measurement apparatus; and an analysis part that estimates a standard data pattern serving as a reference, based on a common portion between a pair of the data in a set of the intermittent data received and determines presence of an anomaly for intermittent data of a determination target received from the measurement apparatus by referring to the standard data pattern.
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