Invention Grant
- Patent Title: Sample identification method based on chemical sensor measurement, sample identification device, and input parameter estimation method
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Application No.: US16463585Application Date: 2017-11-22
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Publication No.: US11353437B2Publication Date: 2022-06-07
- Inventor: Gaku Imamura , Genki Yoshikawa , Takashi Washio
- Applicant: National Institute for Materials Science
- Applicant Address: JP Ibaraki
- Assignee: National Institute for Materials Science
- Current Assignee: National Institute for Materials Science
- Current Assignee Address: JP Ibaraki
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JPJP2016-230468 20161128
- International Application: PCT/JP2017/042060 WO 20171122
- International Announcement: WO2018/097197 WO 20180531
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N19/00 ; G01N29/46 ; G01N29/02 ; G01N29/44

Abstract:
Provided is a novel analysis method that enables identification of a sample even when any sample is introduced during measurement carried out by using a chemical sensor. An input in which the amount of an unknown sample changes over time is provided to the chemical sensor, a response which is from the chemical sensor and which changes over time is measured, a sensor function (transmission function) of the chemical sensor with respect to the unknown sample is calculated on the basis of the input and the response, and the unknown sample is identified on the basis of the sensor function of the chemical sensor with respect to the unknown sample.
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