Invention Grant
- Patent Title: Failure model for predicting failure due to resist layer
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Application No.: US17288167Application Date: 2019-10-22
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Publication No.: US11354484B2Publication Date: 2022-06-07
- Inventor: Steven George Hansen
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2019/078706 WO 20191022
- International Announcement: WO2020/094389 WO 20200514
- Main IPC: G06F30/30
- IPC: G06F30/30 ; G03F7/20 ; G06F30/398 ; G06F30/392

Abstract:
A method of determining a failure model of a resist process of a patterning process. The method includes obtaining (i) measured data of a pattern failure (e.g., failure rate) related to a feature printed on a substrate based on a range of values of dose, and (ii) image intensity values for the feature via simulating a process model using the range of the dose values; and determining, via fitting the measured data of the pattern failure to a product of the dose values and the image intensity values, a failure model to model a stochastic behavior of spatial fluctuations in the resist and optionally predict failure of the feature (e.g., hole closing).
Public/Granted literature
- US20210382393A1 FAILURE MODEL FOR PREDICTING FAILURE DUE TO RESIST LAYER Public/Granted day:2021-12-09
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