Invention Grant
- Patent Title: Detection element, manufacturing method thereof, flat panel detector
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Application No.: US16331326Application Date: 2018-08-23
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Publication No.: US11355534B2Publication Date: 2022-06-07
- Inventor: Xuecheng Hou , Pengcheng Tian , Chuncheng Che , Chia Chiang Lin , Xin Li
- Applicant: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. , BOE TECHNOLOGY GROUP CO., LTD
- Applicant Address: CN Beijing; CN Beijing
- Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.,BOE TECHNOLOGY GROUP CO., LTD
- Current Assignee: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.,BOE TECHNOLOGY GROUP CO., LTD
- Current Assignee Address: CN Beijing; CN Beijing
- Agency: Dilworth & Barrese, LLP.
- Agent Michael J. Musella, Esq.
- Priority: CN201710967141.4 20171017
- International Application: PCT/CN2018/101951 WO 20180823
- International Announcement: WO2019/076130 WO 20190425
- Main IPC: H01L27/146
- IPC: H01L27/146

Abstract:
A detection element, a manufacturing method thereof and a flat panel detector are disclosed. The detection element includes: a base substrate; a photodiode on the base substrate, the photodiode includes: a first electrode on the base substrate; a photoelectric conversion layer on a side of the first electrode away from the base substrate; a transparent electrode and a second electrode electrically connected with the transparent electrode on a side of the photoelectric conversion layer away from the first electrode. Besides, an orthographic projection of the photoelectric conversion layer on the base substrate completely falls within an orthographic projection of the first electrode on the base substrate; the photoelectric conversion layer includes a sidewall, an orthographic projection of the sidewall of the photoelectric conversion layer on the base substrate is at least partially overlapped with an orthographic projection of the second electrode on the base substrate.
Public/Granted literature
- US20210384236A1 DETECTION ELEMENT, MANUFACTURING METHOD THEREOF, FLAT PANEL DETECTOR Public/Granted day:2021-12-09
Information query
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