- 专利标题: Semiconductor device
-
申请号: US16135482申请日: 2018-09-19
-
公开(公告)号: US11355593B2公开(公告)日: 2022-06-07
- 发明人: Takatomi Izumi , Junya Nishii , Yuhei Ikemoto
- 申请人: TOYODA GOSEI CO., LTD.
- 申请人地址: JP Kiyosu
- 专利权人: TOYODA GOSEI CO., LTD.
- 当前专利权人: TOYODA GOSEI CO., LTD.
- 当前专利权人地址: JP Kiyosu
- 代理机构: McGinn IP Law Group, PLLC
- 优先权: JPJP2017-189645 20170929
- 主分类号: H01L29/20
- IPC分类号: H01L29/20 ; H01L21/28 ; H01L21/02 ; H01L29/417 ; H01L29/49 ; H01L29/423 ; H01L29/78 ; H01L29/51 ; H01L21/3205
摘要:
A semiconductor device comprises: a nitride semiconductor layer; an oxide insulating film formed to contact the nitride semiconductor layer; and a gate electrode formed to contact the oxide insulating film and made of metal nitride in a crystal orientation including at least one of the (200) orientation and the (220) orientation.
公开/授权文献
- US20190103464A1 SEMICONDUCTOR DEVICE 公开/授权日:2019-04-04
信息查询
IPC分类: