A test system for testing a device under test is described. The test system includes a testing module and the device under test. The testing module is configured to establish a wireless connection with the device under test based on a wireless communication standard having a low energy protocol. The wireless connection includes a control channel and at least one test channel. The control channel is configured to transmit at least one control message between the testing module and the device under test. The at least one test channel is configured to transmit data packages between the testing module and the device under test, wherein an RF level of the control channel is higher than an RF level of the at least one test channel. Further, a testing method for testing a device under test is described.