Invention Grant
- Patent Title: Metrology sensor for position metrology
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Application No.: US17277353Application Date: 2019-08-27
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Publication No.: US11360399B2Publication Date: 2022-06-14
- Inventor: Sebastianus Adrianus Goorden , Simon Reinald Huisman , Simon Gijsbert Josephus Mathijssen , Henricus Petrus Maria Pellemans
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: EP18195488 20180919,EP19150245 20190103
- International Application: PCT/EP2019/072762 WO 20190827
- International Announcement: WO2020/057900 WO 20200326
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
Disclosed is a metrology device (1600) configured to produce measurement illumination comprising a plurality of illumination beams, each of said illumination beams being spatially incoherent or pseudo-spatially incoherent and comprising multiple pupil points in an illumination pupil of the metrology device. Each pupil point in each one of said plurality of illumination beams has a corresponding pupil point in at least one of the other illumination beams of said plurality of illumination beams thereby defining multiple sets of corresponding pupil points, and the pupil points of each set of corresponding pupil points are spatially coherent with respect to each other.
Public/Granted literature
- US20220035257A1 METROLOGY SENSOR FOR POSITION METROLOGY Public/Granted day:2022-02-03
Information query
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