Invention Grant
- Patent Title: State determination apparatus, state determination method, and computer-readable recording medium
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Application No.: US16646423Application Date: 2017-09-12
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Publication No.: US11365963B2Publication Date: 2022-06-21
- Inventor: Subhajit Chaudhury , Hiroshi Imai
- Applicant: NEC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2017/032848 WO 20170912
- International Announcement: WO2019/053773 WO 20190321
- Main IPC: G06T7/60
- IPC: G06T7/60 ; G01B11/16 ; G01B9/02 ; G06T7/00 ; G01M5/00

Abstract:
A state determination apparatus 100 determines the state of a structure 200. The state determination apparatus 100 includes a measurement unit 10 configured to measure a deflection amount and a surface displacement amount in each of a plurality of target regions that are preset on the structure 200, a feature value calculation unit 20 configured to calculate, for the respective target regions, feature values each indicating a relationship between the deflection amount and the surface displacement amount, using the measured deflection amount and surface displacement amount, a spatial distribution calculation unit 30 configured to calculate a spatial distribution of the feature values using the feature values calculated for each of the target regions, and a degradation state determination unit 40 configured to determine a degradation state of the structure 200 based on the spatial distribution of the feature value.
Public/Granted literature
- US20200284576A1 STATE DETERMINATION APPARATUS, STATE DETERMINATION METHOD, AND COMPUTER-READABLE RECORDING MEDIUM Public/Granted day:2020-09-10
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