Invention Grant
- Patent Title: Test system and test method for charging device
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Application No.: US16626258Application Date: 2018-09-30
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Publication No.: US11368032B2Publication Date: 2022-06-21
- Inventor: Chen Tian
- Applicant: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Applicant Address: CN Guangdong
- Assignee: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Current Assignee: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Current Assignee Address: CN Guangdong
- Agency: Young Basile Hanlon & MacFarlane, P.C.
- International Application: PCT/CN2018/109082 WO 20180930
- International Announcement: WO2020/062237 WO 20200402
- Main IPC: G01R31/30
- IPC: G01R31/30 ; H02J7/00 ; G01R31/40 ; H02J7/06

Abstract:
The present disclosure provides a test system and a test method for a charging device. The test system for the charging device includes a charging device and a power supply module. The charging device has a switch tube and a control module. The power supply module is coupled to a control electrode of the switch tube and is configured to output a voltage signal to the control electrode of the switch tube, so that a voltage between a first end and a second end of the switch tube is greater than a preset voltage protection value. The control module is configured to determine whether the charging device enters a protection state when the voltage between the first end and the second end of the switch tube is greater than the preset voltage protection value, thereby testing a protection function against abnormal voltage drop of the charging device.
Public/Granted literature
- US20210408813A1 Test System and Test Method for Charging Device Public/Granted day:2021-12-30
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