Invention Grant
- Patent Title: Detection of outlier nodes in a cluster
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Application No.: US15186400Application Date: 2016-06-17
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Publication No.: US11368372B2Publication Date: 2022-06-21
- Inventor: Biswa Ranjan Panda , Karan Gupta , Abhinay Nagpal , Deepthi Srinivasan , Roger Sean Liao , Vinayak Hindurao Khot
- Applicant: Nutanix, Inc.
- Applicant Address: US CA San Jose
- Assignee: Nutanix, Inc.
- Current Assignee: Nutanix, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Vista IP Law Group, LLP
- Main IPC: H04L41/142
- IPC: H04L41/142 ; G06F3/06 ; G06F11/34 ; G06F11/30 ; H04L41/12

Abstract:
Systems for cluster computing. A method for detection and remediation of degraded nodes in a cluster commences upon measuring operational aspects of the nodes in the cluster, then determining, based on the measurements and other factors, a suspect set of nodes comprising one or more suspect nodes from the nodes in the cluster that have measurements that are determined to be outliers with respect to remaining nodes that are determined not to be the outliers. A density-based spatial clustering analysis is performed over the suspect set and remediation actions are initiated when results of the density-based spatial clustering analysis identifies a suspect node as being a degraded node.
Public/Granted literature
- US20200036596A1 DETECTION OF OUTLIER NODES IN A CLUSTER Public/Granted day:2020-01-30
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