- Patent Title: X-ray image processing method and X-ray image processing apparatus
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Application No.: US16773317Application Date: 2020-01-27
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Publication No.: US11373308B2Publication Date: 2022-06-28
- Inventor: Jaemock Yi , Mincheol Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2019-0013751 20190201
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G06T7/00 ; G06T7/593

Abstract:
An X-ray image processing method, including obtaining a first X-ray image of an object including a plurality of materials including a first material and a second material different from the first material; obtaining three-dimensional (3D) information about the object using a 3D camera; obtaining first information about a thickness of the object based on the 3D information; and obtaining second information related to a stereoscopic structure of the first material by decomposing the first material from the object using the first information and the first X-ray image.
Public/Granted literature
- US20200250824A1 X-RAY IMAGE PROCESSING METHOD AND X-RAY IMAGE PROCESSING APPARATUS Public/Granted day:2020-08-06
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