- Patent Title: Feature extraction method, comparison system, and storage medium
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Application No.: US16966984Application Date: 2019-02-18
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Publication No.: US11379999B2Publication Date: 2022-07-05
- Inventor: Ryo Kawai
- Applicant: NEC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JPJP2018-027512 20180220
- International Application: PCT/JP2019/005798 WO 20190218
- International Announcement: WO2019/163699 WO 20190829
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/254 ; G06T7/73 ; G06V10/28 ; G06V10/40

Abstract:
The feature extraction device according to one aspect of the present disclosure comprises: a reliability determination unit that determines a degree of reliability with respect to a second region, which is a region that has been extracted as a foreground region of an image and is within a first region that has been extracted from the image as a partial region containing a recognition subject, said degree of reliability indicating the likelihood of being the recognition subject; a feature determination unit that, on the basis of the degree of reliability, uses a first feature which is a feature extracted from the first region and a second feature which is a feature extracted from the second region to determine a feature of the recognition subject; and an output unit that outputs information indicating the determined feature of the recognition subject.
Public/Granted literature
- US20210049777A1 FEATURE EXTRACTION METHOD, COMPARISON SYSTEM, AND STORAGE MEDIUM Public/Granted day:2021-02-18
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