• Patent Title: Feature extraction method, comparison system, and storage medium
  • Application No.: US16966984
    Application Date: 2019-02-18
  • Publication No.: US11379999B2
    Publication Date: 2022-07-05
  • Inventor: Ryo Kawai
  • Applicant: NEC CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: NEC CORPORATION
  • Current Assignee: NEC CORPORATION
  • Current Assignee Address: JP Tokyo
  • Priority: JPJP2018-027512 20180220
  • International Application: PCT/JP2019/005798 WO 20190218
  • International Announcement: WO2019/163699 WO 20190829
  • Main IPC: G06K9/00
  • IPC: G06K9/00 G06T7/254 G06T7/73 G06V10/28 G06V10/40
Feature extraction method, comparison system, and storage medium
Abstract:
The feature extraction device according to one aspect of the present disclosure comprises: a reliability determination unit that determines a degree of reliability with respect to a second region, which is a region that has been extracted as a foreground region of an image and is within a first region that has been extracted from the image as a partial region containing a recognition subject, said degree of reliability indicating the likelihood of being the recognition subject; a feature determination unit that, on the basis of the degree of reliability, uses a first feature which is a feature extracted from the first region and a second feature which is a feature extracted from the second region to determine a feature of the recognition subject; and an output unit that outputs information indicating the determined feature of the recognition subject.
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