Invention Grant
- Patent Title: Electromagnetic wave detection apparatus and information acquisition system
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Application No.: US17051291Application Date: 2019-05-08
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Publication No.: US11381722B2Publication Date: 2022-07-05
- Inventor: Eri Takeuchi
- Applicant: KYOCERA Corporation
- Applicant Address: JP Kyoto
- Assignee: KYOCERA Corporation
- Current Assignee: KYOCERA Corporation
- Current Assignee Address: JP Kyoto
- Agency: Studebaker & Brackett PC
- Priority: JPJP2018-094102 20180515
- International Application: PCT/JP2019/018378 WO 20190508
- International Announcement: WO2019/220974 WO 20191121
- Main IPC: G01S17/89
- IPC: G01S17/89 ; H04N5/225 ; G02B5/04 ; G02B27/12 ; G01S7/481 ; G02B26/08 ; G02B26/10

Abstract:
An electromagnetic wave detection apparatus (10) includes a first propagation unit (16), second propagation unit (17), first detector (19), and second detector (20). The first propagation unit (16) propagates electromagnetic waves incident on a reference surface (ss) in a particular direction at each pixel (px). The second propagation unit (17) includes first through sixth surfaces (s1 to s6). The second surface (s2) separates electromagnetic waves propagated in a second direction (d2) and propagates the electromagnetic waves in a third direction (d3) and fourth direction (d4). The fourth surface (s4) emits electromagnetic waves propagated in the fourth direction (d4) towards the reference surface (ss) and propagates electromagnetic waves incident again from the reference surface (ss) in a fifth direction (d5). The first detector (19) detects electromagnetic waves emitted from the third surface (s3). The second detector (20) detects electromagnetic waves emitted from the sixth surface (s6).
Public/Granted literature
- US20210368075A1 ELECTROMAGNETIC WAVE DETECTION APPARATUS AND INFORMATION ACQUISITION SYSTEM Public/Granted day:2021-11-25
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