- 专利标题: Semiconductor device and manufacturing method thereof
-
申请号: US16909968申请日: 2020-06-23
-
公开(公告)号: US11417601B2公开(公告)日: 2022-08-16
- 发明人: Xin-Yong Wang , Liu Han , Li-Chun Tien , Chih-Liang Chen
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. , TSMC NANJING COMPANY LIMITED , TSMC CHINA COMPANY LIMITED
- 申请人地址: TW Hsinchu; CN Nanjing; CN Shanghai
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.,TSMC NANJING COMPANY LIMITED,TSMC CHINA COMPANY LIMITED
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.,TSMC NANJING COMPANY LIMITED,TSMC CHINA COMPANY LIMITED
- 当前专利权人地址: TW Hsinchu; CN Nanjing; CN Shanghai
- 代理机构: Maschoff Brennan
- 优先权: CN202010504218.6 20200605
- 主分类号: H01L27/11
- IPC分类号: H01L27/11 ; H01L23/528 ; H01L21/8234 ; H01L23/522 ; H01L27/088
摘要:
A device includes a transistor, an insulating structure, a buried conductive line, and a buried via. The transistor is above a substrate and includes a source/drain region and a source/drain contact above the source/drain region. The insulating structure is above the substrate and laterally surrounds the transistor. The buried conductive line is in the insulating structure and spaced apart from the transistor. The buried via is in the insulating structure and interconnects the transistor and the buried conductive line. A height of the buried conductive line is greater than a height of the source/drain contact.
公开/授权文献
- US20210384128A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF 公开/授权日:2021-12-09
信息查询
IPC分类: