Invention Grant
- Patent Title: Determining a device wear-rate
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Application No.: US17083689Application Date: 2020-10-29
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Publication No.: US11429283B2Publication Date: 2022-08-30
- Inventor: Christoph J. Graham , Thomas J. Flynn , Virginia Quance Herrera
- Applicant: Hewlett-Packard Development Company, L.P.
- Applicant Address: US TX Spring
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Spring
- Agency: Brooks Cameron & Huebsch PLLC
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G06F11/34 ; G06F11/30 ; G06F11/07 ; G06F11/00

Abstract:
Example implementations relate to determining a device wear-rate. An example system for determining a device wear-rate can include a plurality of filter drivers to: monitor system requests for I/O associated with a device of the system and transmit information associated with the system requests to a filter manager. The system can also include the filter manager to catalog the information, a service to collate the information across a plurality of machine configurations and workloads, and a processor to determine a wear-rate of the device based on an analysis of the collated information.
Public/Granted literature
- US20210042042A1 DETERMINING A DEVICE WEAR-RATE Public/Granted day:2021-02-11
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