- 专利标题: Product analysis system, product analysis method, and product analysis program
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申请号: US16977923申请日: 2018-03-09
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公开(公告)号: US11443503B2公开(公告)日: 2022-09-13
- 发明人: Kyota Higa , Emi Kitagawa
- 申请人: NEC CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: NEC CORPORATION
- 当前专利权人: NEC CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 国际申请: PCT/JP2018/009205 WO 20180309
- 国际公布: WO2019/171574 WO 20190912
- 主分类号: G06V10/26
- IPC分类号: G06V10/26 ; G06V10/56 ; G06V20/52 ; G06V40/20 ; G06V40/10
摘要:
A product analysis system 800 includes a detection means 810, a classification means 820, and a specification means 830. The detection means 810 detects an area of change in a product shelf from a video of the product shelf. The classification means 820 classifies the change in the product shelf in the detected area of change. The specification means 830 specifies the frequency at which a customer was interested in but did not purchase a product on the basis of the classification of the change.
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