Invention Grant
- Patent Title: Analyzer, analysis method, analyzer program, and analysis learning device
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Application No.: US16492529Application Date: 2018-08-01
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Publication No.: US11448588B2Publication Date: 2022-09-20
- Inventor: Yoshitake Ando , Masayuki Adachi
- Applicant: HORIBA, LTD.
- Applicant Address: JP Kyoto
- Assignee: HORIBA, LTD.
- Current Assignee: HORIBA, LTD.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JPJP2017-152787 20170807
- International Application: PCT/JP2018/028812 WO 20180801
- International Announcement: WO2019/031331 WO 20190214
- Main IPC: G01N21/3504
- IPC: G01N21/3504 ; G01N21/35
Abstract:
An analyzer that analyzes a measurement sample on the basis of spectrum data obtained by irradiating the measurement sample with light and includes a total analysis value calculation part that, on the basis of the total analysis value of a reference sample of which the total analysis value of multiple predetermined components are preliminarily obtained, calculates the total analysis value of the multiple components in the measurement sample from the spectrum data of the measurement sample.
Public/Granted literature
- US20210140877A1 ANALYZER, ANALYSIS METHOD, ANALYZER PROGRAM, AND ANALYSIS LEARNING DEVICE Public/Granted day:2021-05-13
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