Invention Grant
- Patent Title: Artificial intelligence device and method of diagnosing malfunction using operation log and artificial intelligence model
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Application No.: US16557253Application Date: 2019-08-30
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Publication No.: US11449045B2Publication Date: 2022-09-20
- Inventor: Jongwoo Han
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: KR10-2019-0089186 20190723
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G06K9/62 ; G05B13/02 ; G06N3/08

Abstract:
An artificial intelligence (AI) device includes a sensing unit configured to collect operation log including information on an external environment factor and an operation state of an AI device, a memory configured to store data corresponding to the operation log, and a processor configured to provide the data corresponding to the operation log to an AI model, to acquire information about whether the AI device corresponds to a normal range or a malfunction symptom range, and to perform control based on the acquired information.
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