- 专利标题: System for inspecting equipment and materials for quality
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申请号: US17687566申请日: 2022-03-04
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公开(公告)号: US11454612B1公开(公告)日: 2022-09-27
- 发明人: Seung Hee Park , Han Sun Kim
- 申请人: SMARTINSIDE AI Inc.
- 申请人地址: KR Suwon-si
- 专利权人: SMARTINSIDE AI Inc.
- 当前专利权人: SMARTINSIDE AI Inc.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Patent Office of Dr. Chung Park
- 优先权: KR10-2021-0031876 20210311
- 主分类号: G01N27/83
- IPC分类号: G01N27/83 ; G01R33/02
摘要:
Disclosed herein is a system for inspecting equipment and materials for quality. The system for inspecting equipment and materials for quality includes: a magnetic sensor configured to generate a magnetic field in an inspection target object, and to detect magnetic flux density; and a quality inspection server configured to determine the presence of a defect, a portion where the detect is present, and the type of defect for the inspection target object based on magnetic flux density waveforms over a range from one end of the inspection target object to the other end thereof that are generated via signals detected by the magnetic sensor.
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