Invention Grant
- Patent Title: Variable resistance memory device and method of manufacturing the same
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Application No.: US16416472Application Date: 2019-05-20
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Publication No.: US11456414B2Publication Date: 2022-09-27
- Inventor: Jonguk Kim , Young-Min Ko , Byongju Kim , Jaeho Jung , Dongsung Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2018-0118205 20181004
- Main IPC: H01L27/24
- IPC: H01L27/24 ; H01L45/00

Abstract:
A method of manufacturing a variable resistance memory device may include: forming a memory cell including a variable resistance pattern on a substrate; performing a first process to deposit a first protective layer covering the memory cell; and performing a second process to deposit a second protective layer on the first protective layer. The first process and the second process may use the same source material and the same nitrogen reaction material, and a nitrogen content in the first protective layer may be less than a nitrogen content in the second protective layer.
Information query
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