Invention Grant
- Patent Title: Method and apparatus for inspecting burrs of electrode slice
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Application No.: US16683766Application Date: 2019-11-14
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Publication No.: US11461995B2Publication Date: 2022-10-04
- Inventor: Yawei Wen , Jiabing Leng , Minghao Liu , Jiangliang Guo , Xu Li
- Applicant: BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
- Current Assignee: BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: CN201810912648.4 20180810
- Main IPC: G06V10/44
- IPC: G06V10/44 ; G06K9/62

Abstract:
Embodiments of the present disclosure provides a method and apparatus for inspecting burrs of an electrode slice. The method may include: acquiring a to-be-inspected electrode slice image; and inputting the to-be-inspected electrode slice image into a pre-trained burr instance segmentation model to obtain inspection result for characterizing whether the electrode slice displayed in the to-be-inspected electrode slice image has burrs and contour of the burrs, where the burr instance segmentation model is used to characterize the corresponding relationship between the electrode slice image and the inspection result and contour information. The method may further include: and outputting, in response to the inspection result for characterizing that the electrode slice displayed in the to-be-inspected electrode slice image has burrs, prompt information for characterizing that the electrode slice displayed in the to-be-inspected electrode slice image has burrs.
Public/Granted literature
- US20200082199A1 METHOD AND APPARATUS FOR INSPECTING BURRS OF ELECTRODE SLICE Public/Granted day:2020-03-12
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