- Patent Title: Rapid temperature measurement by wavelength modulation spectroscopy
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Application No.: US16838212Application Date: 2020-04-02
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Publication No.: US11467037B2Publication Date: 2022-10-11
- Inventor: Yue Tian , Da Pan
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Agent Joseph Kolodka
- Main IPC: G01J5/60
- IPC: G01J5/60 ; G01J5/00

Abstract:
Aspects of the present disclosure describe rapid temperature measurement by wavelength modulation spectroscopy (WMS) that determines gas temperature from 2ƒ signals from two absorption lines by WMS methodologies even when the gas concentration is sufficiently high to saturate optical absorptions. In sharp contrast to the prior art, rapid temperature measurement by WMS according to aspects of the present disclosure employs both a 2ƒ signal ratio and gas concentration determined from the 2ƒ signal.
Public/Granted literature
- US20200319034A1 RAPID TEMPERATURE MEASUREMENT BY WAVELENGTH MODULATION SPECTROSCOPY Public/Granted day:2020-10-08
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