Invention Grant
- Patent Title: Substrate processing method and plasma processing apparatus
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Application No.: US17039295Application Date: 2020-09-30
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Publication No.: US11469111B2Publication Date: 2022-10-11
- Inventor: Shinya Ishikawa , Toru Hisamatsu
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Weihrouch IP
- Priority: JPJP2019-181500 20191001
- Main IPC: H01L21/311
- IPC: H01L21/311 ; H01L21/027 ; H01J37/32

Abstract:
A method for processing a substrate for processing a substrate includes: (a) providing a substrate having an etching region and a patterned region on the etching region; (b) forming an organic film on a surface of the substrate; and (c) etching the etching region using plasma generated from a processing gas through the patterned region. The step (b) includes (b1) supplying a first gas containing an organic compound to the substrate to form a precursor layer on the substrate, and (b2) supplying a second gas containing a modifying gas to the substrate and supplying energy to the precursor layer and/or the second gas to modify the precursor layer.
Public/Granted literature
- US20210098263A1 SUBSTRATE PROCESSING METHOD AND PLASMA PROCESSING APPARATUS Public/Granted day:2021-04-01
Information query
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