Invention Grant
- Patent Title: Stress detection device
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Application No.: US17414493Application Date: 2019-12-02
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Publication No.: US11473986B2Publication Date: 2022-10-18
- Inventor: Hiroyuki Taneda , Kenichiro Tami , Minoru Komiya
- Applicant: NHK Spring Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Locke Lord LLP
- Priority: JPJP2018-248444 20181228
- International Application: PCT/JP2019/047094 WO 20191202
- International Announcement: WO2020/137374 WO 20200702
- Main IPC: G01L1/12
- IPC: G01L1/12 ; G01L5/00 ; G01L5/04

Abstract:
A stress detection device includes: a first detector including a first magnetostrictive member configured to be deformed by tensile stress or compression stress in accordance with a load from outside, and a first wound portion made of a conductive material and configured to be wound around the first magnetostrictive member; and a second detector including a second magnetostrictive member having a magnetostrictive constant different from a magnetostrictive constant of the first magnetostrictive member, the second magnetostrictive member being configured to be deformed by tensile stress or compression stress in accordance with a load from outside, and a second wound portion made of a conductive material and configured to be wound around the second magnetostrictive member, wherein the first detector and the second detector are configured to electrically detect strength of magnetic permeability due to compression stress or tensile stress, and output detection signals having opposite signals.
Public/Granted literature
- US20220065713A1 STRESS DETECTION DEVICE Public/Granted day:2022-03-03
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