发明授权
- 专利标题: GaN/diamond wafers
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申请号: US16914474申请日: 2020-06-29
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公开(公告)号: US11476335B2公开(公告)日: 2022-10-18
- 发明人: Won Sang Lee
- 申请人: RFHIC Corporation
- 申请人地址: KR Anyang-si
- 专利权人: RFHIC Corporation
- 当前专利权人: RFHIC Corporation
- 当前专利权人地址: KR Anyang-si
- 代理机构: Kim & Stewart LLP
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L29/20 ; H01L21/768 ; H01L29/205 ; H01L29/267 ; H01L29/66 ; H01L29/16 ; H01L23/00
摘要:
Wafers including a diamond layer and a semiconductor layer having III-Nitride compounds and methods for fabricating the wafers are provided. A nucleation layer, at least one semiconductor layer having III-Nitride compound and a protection layer are formed on a silicon substrate. Then, a silicon carrier wafer is glass bonded to the protection layer. Subsequently the silicon substrate, nucleation layer and a portion of the semiconductor layer are removed. Then, an intermediate layer, a seed layer and a diamond layer are sequentially deposited on the III-Nitride layer. Next, a support wafer that includes a GaN layer (or a silicon layer covered by a protection layer) is deposited on the diamond layer. Then, the silicon carrier wafer and the protection layer are removed.
公开/授权文献
- US20210249511A1 GaN/DIAMOND WAFERS 公开/授权日:2021-08-12
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