Invention Grant
- Patent Title: Probe apparatus
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Application No.: US16615239Application Date: 2018-05-22
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Publication No.: US11486900B2Publication Date: 2022-11-01
- Inventor: Vladimir Ermolov , Antti Lamminen , Jussi Säily , Tauno Vähä-Heikkilä , Pekka Rantakari
- Applicant: TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
- Applicant Address: FI Espoo
- Assignee: TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
- Current Assignee: TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
- Current Assignee Address: FI Espoo
- Agency: Nixon & Vanderhye PC
- Priority: FI20175463 20170523
- International Application: PCT/FI2018/050385 WO 20180522
- International Announcement: WO2018/215694 WO 20181129
- Main IPC: G01R1/24
- IPC: G01R1/24 ; G01R1/067 ; G01R21/01 ; H01P5/107 ; H01P5/12

Abstract:
A probe apparatus of a millimeter or submillimeter radio frequency band comprises transition layers having outermost layers on opposite surfaces of the probe apparatus. An internal transition cavity extends through the transition layers for guiding electromagnetic radiation within the probe apparatus. A probe layer disposed between the transition layers, the probe layer having a lateral transmission line for interacting with the electromagnetic radiation guided by the internal transmission cavity.
Public/Granted literature
- US20200158757A1 PROBE APPARATUS Public/Granted day:2020-05-21
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