Invention Grant
- Patent Title: Bode fingerprinting for characterizations and failure detections in processing chamber
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Application No.: US16838834Application Date: 2020-04-02
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Publication No.: US11486927B2Publication Date: 2022-11-01
- Inventor: Tao Zhang , Upendra V. Ummethala , Ajit Balakrishna
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Lowenstein Sandler LLP
- Main IPC: G01D21/02
- IPC: G01D21/02 ; G05B13/02 ; G01F1/84 ; G01R31/3177 ; G01F1/86

Abstract:
A non-transitory computer-readable storage medium stores instructions, which when executed by a processing device of a diagnostic server, cause the processing device to perform certain operations. The operations include receiving, from a processing chamber, (i) measurement values of a combined signal that is based on an injection of an alternating signal wave onto a first output signal of a controller of the processing chamber, and (ii) measurement values of a second output signal of the controller that incorporates feedback from the processing chamber. The operations further include generating, based on the measurement values of the combined signal and the measurement values of the second output signal of the controller, a baseline bode fingerprint pertaining to a state associated with the processing chamber. The operations further include storing, in computer storage, the baseline bode fingerprint to be used in performing diagnostics of the processing chamber.
Public/Granted literature
- US20210311114A1 BODE FINGERPRINTING FOR CHARACTERIZATIONS AND FAILURE DETECTIONS IN PROCESSING CHAMBER Public/Granted day:2021-10-07
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