Invention Grant
- Patent Title: Optical measuring device and optical measuring method
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Application No.: US16825233Application Date: 2020-03-20
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Publication No.: US11493329B2Publication Date: 2022-11-08
- Inventor: Ryoichi Imaizumi , Ichiro Taniguchi
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kawasaki
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2019-072408 20190405
- Main IPC: G01B11/08
- IPC: G01B11/08 ; G01B11/24

Abstract:
An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallelly moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.
Public/Granted literature
- US11530911B2 Optical measuring device and optical measuring method Public/Granted day:2022-12-20
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