Invention Grant
- Patent Title: Image analysis device, image analysis method, and program
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Application No.: US17273975Application Date: 2019-09-04
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Publication No.: US11494945B2Publication Date: 2022-11-08
- Inventor: Yuji Masuda , Megumi Sekino , Hironobu Yoshikawa , David Christopher Berends , Michael Anthony Isnardi , Yuzheng Zhang
- Applicant: SHISEIDO COMPANY, LTD.
- Applicant Address: JP Tokyo
- Assignee: SHISEIDO COMPANY, LTD.
- Current Assignee: SHISEIDO COMPANY, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- International Application: PCT/JP2019/034706 WO 20190904
- International Announcement: WO2020/050295 WO 20200312
- Main IPC: G06T7/90
- IPC: G06T7/90 ; H04N5/225 ; H04N5/235

Abstract:
An image analysis device according to the present invention includes: an image capturing unit that captures a subject; a light emitting unit that emits light to the subject; a control unit that causes the image capturing unit to capture a first image of the subject while causing the light emitting unit to emit light and causes the image capturing unit to capture a second image of the subject while not causing the light emitting unit to emit light; and an estimation unit that estimates color of the subject based on a differential value between color information on the first image and the color information on the second image.
Public/Granted literature
- US20210350577A1 IMAGE ANALYSIS DEVICE, IMAGE ANALYSIS METHOD, AND PROGRAM Public/Granted day:2021-11-11
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