Invention Grant
- Patent Title: Semiconductor device and method of fabricating the same
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Application No.: US17153963Application Date: 2021-01-21
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Publication No.: US11495533B2Publication Date: 2022-11-08
- Inventor: Jihoon Chang , Jimin Choi , Yeonjin Lee , Hyeon-Woo Jang , Jung-Hoon Han
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2020-0037771 20200327,KR10-2020-0095459 20200730
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/532

Abstract:
The method includes forming a first dielectric layer on a substrate, forming a via in the first dielectric layer, sequentially forming a first metal pattern, a first metal oxide pattern, a second metal pattern, and an antireflective pattern on the first dielectric layer, and performing an annealing process to react the first metal oxide pattern and the second metal pattern with each other to form a second metal oxide pattern. The forming the second metal oxide pattern includes forming the second metal oxide pattern by a reaction between a metal element of the second metal pattern and an oxygen element of the first metal oxide pattern.
Public/Granted literature
- US20210305153A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Public/Granted day:2021-09-30
Information query
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