• Patent Title: Ophthalmic microscope and functionality enhancement unit
  • Application No.: US16610259
    Application Date: 2018-05-02
  • Publication No.: US11503996B2
    Publication Date: 2022-11-22
  • Inventor: Yasufumi FukumaKazuhiro Oomori
  • Applicant: Topcon Corporation
  • Applicant Address: JP Tokyo
  • Assignee: Topcon Corporation
  • Current Assignee: Topcon Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: BakerHostetler
  • Priority: JPJP2017-091997 20170502,JPJP2017-165187 20170830,JPJP2018-056763 20180323
  • International Application: PCT/JP2018/017568 WO 20180502
  • International Announcement: WO2018/203577 WO 20181108
  • Main IPC: A61B3/10
  • IPC: A61B3/10 A61B3/13
Ophthalmic microscope and functionality enhancement unit
Abstract:
The object of the present invention is to develop an ophthalmologic microscope of a new method that increases the degree of freedom in the optical design in the Galilean ophthalmologic microscope provided with an OCT optical system. The present invention provides an ophthalmologic microscope 1 comprising; an illuminating optical system 300, an observation optical system 400; an objective lens 2; and an OCT optical system 500, characterized in that the optical axis O-500 of the OCT optical system does not penetrate through the objective lens 2, it comprises objective lens for OCT 507 through which the optical axis O-500 of the OCT optical system penetrates, and deflection optical elements 503a, 503b for scanning of the OCT optical system and the objective lens for OCT 507 are in a substantially optically conjugate positional relation.
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