Invention Grant
- Patent Title: Interconnect structure including graphene-metal barrier and method of manufacturing the same
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Application No.: US16861891Application Date: 2020-04-29
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Publication No.: US11508664B2Publication Date: 2022-11-22
- Inventor: Keunwook Shin , Kibum Kim , Hyunmi Kim , Hyeonjin Shin , Sanghun Lee
- Applicant: Samsung Electronics Co., Ltd. , SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
- Applicant Address: KR Suwon-si; KR Seoul
- Assignee: Samsung Electronics Co., Ltd.,SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
- Current Assignee: Samsung Electronics Co., Ltd.,SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
- Current Assignee Address: KR Suwon-si; KR Seoul
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2019-0050992 20190430,KR10-2020-0051832 20200428
- Main IPC: H01L23/538
- IPC: H01L23/538 ; H01L29/16 ; H01L23/532 ; H01L23/00

Abstract:
An interconnect structure may include a graphene-metal barrier on a substrate and a conductive layer on the graphene-metal barrier. The graphene-metal barrier may include a plurality of graphene layers and metal particles on grain boundaries of each graphene layer between the plurality of graphene layers. The metal particles may be formed at a ratio of 1 atom % to 10 atom % with respect to carbon of the plurality of graphene layers.
Public/Granted literature
- US20200350252A1 INTERCONNECT STRUCTURE INCLUDING GRAPHENE-METAL BARRIER AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2020-11-05
Information query
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