• Patent Title: Offset nulling for optical power meters
  • Application No.: US17002970
    Application Date: 2020-08-26
  • Publication No.: US11519782B2
    Publication Date: 2022-12-06
  • Inventor: Nelu Radu
  • Applicant: EXFO Inc.
  • Applicant Address: CA Quebec
  • Assignee: EXFO Inc.
  • Current Assignee: EXFO Inc.
  • Current Assignee Address: CA Quebec
  • Agent Helene Chotard
  • Main IPC: G01J1/44
  • IPC: G01J1/44
Offset nulling for optical power meters
Abstract:
There is provided an optical power measurement method, an offset calibration method and an optical power meter that is adapted to apply the offset calibration method. The optical power measurement method, the offset calibration method and the optical power meter are characterized in that two temperature sensors are used for more accurate predictions of the optical power offset. A first temperature sensor is positioned to read a temperature of the photodiode and a second temperature sensor is positioned to read a temperature of the PCB ground plane.
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