Invention Grant
- Patent Title: 3-dimensional measuring device
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Application No.: US16106309Application Date: 2018-08-21
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Publication No.: US11520015B2Publication Date: 2022-12-06
- Inventor: Yasushi Tanaka , Takaaki Saito , Ken'ichiro Yoshino , Mitsuru Kanokogi
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Chiesa Shahinian & Giantomasi PC
- Priority: JPJP2017-161303 20170824
- Main IPC: G01S7/481
- IPC: G01S7/481 ; G01S7/497 ; G01J3/10 ; G01S17/89 ; G01S17/10 ; G01S17/42

Abstract:
A 3-dimensional measuring device includes: a light source unit; a projection optical system; a scanning mirror that is provided to be rotatable about a rotating shaft in a state of being inclined with respect to a shaft center of the rotating shaft to radiate a range-finding light within a plane crossing the rotating shaft in a rotary manner; a light-receiving optical system that receives a reflection range-finding light; a reference light optical system that is provided in a range outside a measuring range within a radiation range to receive and reflect the range-finding light as an internal reference light, the reference light optical system being capable of changing a light quantity of the internal reference light; and a light receiving element that receives the reflection range-finding light and the internal reference light.
Public/Granted literature
- US20190064326A1 3-DIMENSIONAL MEASURING DEVICE Public/Granted day:2019-02-28
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