Invention Grant
- Patent Title: Thermistor die-based thermal probe
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Application No.: US15973964Application Date: 2018-05-08
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Publication No.: US11525739B2Publication Date: 2022-12-13
- Inventor: Matthew David Romig , Steven Aldred Kummerl , Steve Edward Harrell
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Frank D. Cimino
- Main IPC: H01C7/10
- IPC: H01C7/10 ; G01K1/08 ; H01C7/00 ; G01K7/24 ; H01C1/01 ; H01C1/034 ; H01C17/00

Abstract:
A thermistor-based thermal probe includes a thermistor die having a thermistor thereon with first and second bond pads coupled across the thermistor, and first and second die interconnects coupled to the respective bond pads. First and second wires W1, W2 that extend beyond the thermistor die are attached to the first and to the second die interconnects, respectively. An encapsulant material encapsulates the thermistor die and a die end of the first and second wires.
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