- 专利标题： Distance measuring apparatus which detects optical system abnormality
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申请号： US16420161申请日： 2019-05-23
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公开(公告)号： US11525917B2公开(公告)日： 2022-12-13
- 发明人: Minoru Nakamura , Yuuki Takahashi , Atsushi Watanabe
- 申请人： FANUC CORPORATION
- 申请人地址： JP Yamanashi
- 专利权人： FANUC CORPORATION
- 当前专利权人： FANUC CORPORATION
- 当前专利权人地址： JP Yamanashi
- 代理机构： Hauptman Ham, LLP
- 优先权： JPJP2018-140430 20180726
- 主分类号： G01S17/36
- IPC分类号： G01S17/36 ; G01S17/89 ; G01S7/4913 ; G01S7/497
摘要：
A distance measuring apparatus includes an optical system abnormality detection section for detecting abnormalities of an optical system of the distance measuring apparatus by comparing a relationship between a measured distance value d and a light intensity Ls with a reference value Kρ, Kρ1, KLs0d0, or KAb0.