Disclosed are a test signal access board and a lighting jig, including: a substrate layer; and a data signal access part arranged on the substrate layer and including at least two rows of conductive contacts, where the conductive contacts are configured to be electrically connected with data signal test leads of a display panel; the conductive contacts in adjacent rows are arranged in a staggered manner; and a staggered pitch between the conductive contacts in adjacent rows is less than a pitch between the data signal test leads of the display panel.