Invention Grant
- Patent Title: Hardness tester and program
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Application No.: US16950076Application Date: 2020-11-17
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Publication No.: US11536636B2Publication Date: 2022-12-27
- Inventor: Koji Shinza , Fumihiko Koshimizu
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2019-210086 20191121
- Main IPC: G01N3/16
- IPC: G01N3/16 ; G01N3/02 ; G06T7/00 ; G01N3/42 ; G06V20/20

Abstract:
A hardness tester includes an image acquirer (controller) acquiring an image of a surface (surface image) of a sample captured by an image capturer, an identifier (controller) identifying, based on the surface image of the sample, a non-conformity region inside the image that is unsuitable for the hardness test using predetermined conditions, and a test position definer (controller) defining a test position in an area outside the non-conformity region identified by the identifier.
Public/Granted literature
- US20210156777A1 HARDNESS TESTER AND PROGRAM Public/Granted day:2021-05-27
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