Invention Grant
- Patent Title: Radiation monitor and radiation measurement method
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Application No.: US16645513Application Date: 2018-08-30
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Publication No.: US11536858B2Publication Date: 2022-12-27
- Inventor: Takahiro Tadokoro , Yuichiro Ueno , Katsunori Ueno , Kouichi Okada , Shuichi Hatakeyama , Yasushi Nagumo , Takahiro Itou , Yoshinobu Sakakibara
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2017-217545 20171110
- International Application: PCT/JP2018/032166 WO 20180830
- International Announcement: WO2019/092955 WO 20190516
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/02

Abstract:
Provided is a radiation monitor and the like capable of appropriately measuring radiation. A radiation monitor (100) includes: radiation detection units (11, 12); optical fibers (13p, 13q) that transmit light generated by a plurality of radiation detection elements (11a, 12a) to merge; a light detection unit (14) that converts the light after merging guided to the light detection unit into an electric pulse; a measurement device (15) that calculates a dose rate of radiation based on a count rate of the electric pulses; and an analysis/display device (16). Housings (11b, 12b) include a housing (11b) made of a first material and another housing (12b) made of a second material.
Public/Granted literature
- US20200278458A1 RADIATION MONITOR AND RADIATION MEASUREMENT METHOD Public/Granted day:2020-09-03
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