Invention Grant
- Patent Title: Pixel circuit and testing method
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Application No.: US17417440Application Date: 2020-11-26
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Publication No.: US11538375B2Publication Date: 2022-12-27
- Inventor: Shicheng Sun , Jonguk Kwak , Dawei Shi , Wei Zhang , Cunzhi Li , Pei Wang
- Applicant: Chongqing BOE Display Technology Co., Ltd. , BOE Technology Group Co., Ltd.
- Applicant Address: CN Chongqing; CN Beijing
- Assignee: Chongqing BOE Display Technology Co., Ltd.,BOE Technology Group Co., Ltd.
- Current Assignee: Chongqing BOE Display Technology Co., Ltd.,BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Chongqing; CN Beijing
- Agency: IPRO, PLLC
- Priority: CN201911190017.7 20191128
- International Application: PCT/CN2020/131773 WO 20201126
- International Announcement: WO2021/104372 WO 20210603
- Main IPC: G09G3/3266
- IPC: G09G3/3266 ; G09G3/3275 ; G09G3/00

Abstract:
The disclosure relates to a pixel circuit and a testing method of the pixel circuit. The pixel circuit comprises a light emitting element, a storage capacitor Cst, a drive sub-circuit, a reset sub-circuit, a write sub-circuit, a light emission control sub-circuit and a testing element, wherein a control terminal of the testing element is connected to s reset control signal line, a first terminal of the testing element is connected to a reset signal line, a second terminal of the testing element is connected to the drive sub-circuit, and the testing element is configured to test elements included in the pixel circuit.
Public/Granted literature
- US20220076601A1 Pixel Circuit and Testing Method Public/Granted day:2022-03-10
Information query
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