Invention Grant
- Patent Title: Sample holder and charged particle beam device
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Application No.: US17028461Application Date: 2020-09-22
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Publication No.: US11538656B2Publication Date: 2022-12-27
- Inventor: Toshiyuki Iwahori
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holland & Hart LLP
- Priority: JPJP2019-173703 20190925
- Main IPC: H01J37/20
- IPC: H01J37/20

Abstract:
A sample holder (19) includes a base portion (41), a sample carrying portion (42), a rotation guide portion (43), a cooling stage (46), a connection member (47), a first support portion, and a fixing guide portion (48). The base portion (41) is configured to be fixed to a stage (12), which is configured to be driven to rotate by a stage driving mechanism (13). The rotation guide portion (43) is configured to guide synchronous rotation of the base portion (41) and the sample carrying portion (42). The cooling stage (46) is configured to cool a sample (S). The connection member (47) is configured to be connected to the cooling stage (46). The first support portion is configured to support the base portion (41), which is configured to be driven to rotate by the stage (12).
Public/Granted literature
- US20210090848A1 SAMPLE HOLDER AND CHARGED PARTICLE BEAM DEVICE Public/Granted day:2021-03-25
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