Invention Grant
- Patent Title: Method and apparatus for determining analytics for service experience for a network slice instance
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Application No.: US17036367Application Date: 2020-09-29
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Publication No.: US11540165B2Publication Date: 2022-12-27
- Inventor: David Gutierrez Estevez , Andrew Bennett
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: GB1914393 20191004,GB2002219 20200218,GB2006083 20200424,GB2009805 20200626
- Main IPC: H04W28/02
- IPC: H04W28/02 ; H04W24/08
Abstract:
A method for determining analytics for service experience for a Network Slice instance in a network comprising one or more network entities is provided. The method includes obtaining first information for determining a mapping between a set of one or more user equipment (UEs) and a set of one or more Network Slice instances, obtaining second information for determining the analytics of the set of one or more UEs, and determining the analytics for a Network Slice instance based on the first information and the second information.
Public/Granted literature
- US20210105656A1 METHOD AND APPARATUS FOR DETERMINING ANALYTICS FOR SERVICE EXPERIENCE FOR A NETWORK SLICE INSTANCE Public/Granted day:2021-04-08
Information query
