Invention Grant
- Patent Title: Scanning-type x-ray source and imaging system therefor
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Application No.: US17137064Application Date: 2020-12-29
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Publication No.: US11569055B2Publication Date: 2023-01-31
- Inventor: Zhili Cui , Jian Gao , Jinhui Xing
- Applicant: Zhili Cui , Jian Gao , Jinhui Xing
- Applicant Address: CN Beijing; CN Beijing; CN Beijing
- Assignee: Zhili Cui,Jian Gao,Jinhui Xing
- Current Assignee: Zhili Cui,Jian Gao,Jinhui Xing
- Current Assignee Address: CN Beijing; CN Beijing; CN Beijing
- Agency: Upstream Research and Patent LLC
- Agent George Guosheng Wang
- Priority: CN201810694166.6 20180629,CN201821016550.2 20180629
- Main IPC: H01J35/30
- IPC: H01J35/30 ; H01J35/04 ; H01J35/18 ; H01J35/08 ; H01J35/14 ; H01J35/12 ; H01J35/06 ; G01N23/046

Abstract:
Provided are a scanning-type X-ray source and an imaging system therefor. The scanning-type X-ray source comprises a vacuum cavity (1), wherein a cathode (2) and a plurality of anode target structures (3) are arranged in the vacuum cavity (1); a gate electrode (4) is arranged in a position, close to the cathode (2), in the vacuum cavity (1); a focusing electrode (5) is arranged in a position, close to the gate electrode (4), in the vacuum cavity (1); and a deflection coil (6) is arranged in a position, close to the gate electrode (4), at the outer periphery of the vacuum cavity (1). The scanning-type X-ray source generates electron beams by using cathode (2), controls the powering-on/off of the electron beams by the gate electrode (4), and the deflection coil (6) controls the direction of motion of the electron beams, so as to complete the switching between multiple focuses.
Public/Granted literature
- US20210148840A1 SCANNING-TYPE X-RAY SOURCE AND IMAGING SYSTEM THEREFOR Public/Granted day:2021-05-20
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