Invention Grant
- Patent Title: Apparatus and method for determining refractive index, central tension, or stress profile
-
Application No.: US17103105Application Date: 2020-11-24
-
Publication No.: US11573078B2Publication Date: 2023-02-07
- Inventor: William John Furnas , Jin Su Kim , Balamurugan Meenakshi Sundaram
- Applicant: CORNING INCORPORATED
- Applicant Address: US NY Corning
- Assignee: CORNING INCORPORATED
- Current Assignee: CORNING INCORPORATED
- Current Assignee Address: US NY Corning
- Main IPC: G01B11/16
- IPC: G01B11/16 ; G01L1/24

Abstract:
Apparatus can comprise a cavity at least partially defined by a first major surface of a reference block and configured to receive a sample. The apparatus can comprise a first polarization-switching light source configured to emit a first polarization-switched light beam toward the cavity and a first detector configured to detect a corresponding signal. The apparatus can comprise a second polarization-switching light source configured to emit a second polarization-switched light beam toward the cavity and a second detector configured to detect a corresponding signal. The first reference block can be positioned between the second detector and the second reference block. Methods of determining an estimated stress profile can comprise determining a central tension from a measured retardation profile of the sample. Methods can comprise determining an initial stress profile from a refractive index profile of the sample. Methods can comprise scaling and adjusting stress profiles.
Public/Granted literature
- US20210156674A1 APPARATUS AND METHOD FOR DETERMINING REFRACTIVE INDEX, CENTRAL TENSION, OR STRESS PROFILE Public/Granted day:2021-05-27
Information query