Invention Grant
- Patent Title: Inspection method of examination system and examination system
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Application No.: US17187586Application Date: 2021-02-26
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Publication No.: US11574396B2Publication Date: 2023-02-07
- Inventor: Eijiro Furuta
- Applicant: NHK SPRING CO., LTD.
- Applicant Address: JP Yokohama
- Assignee: NHK SPRING CO., LTD.
- Current Assignee: NHK SPRING CO., LTD.
- Current Assignee Address: JP Yokohama
- Agency: Holtz, Holtz & Volek PC
- Priority: JPJP2020-036996 20200304
- Main IPC: G06T7/00
- IPC: G06T7/00

Abstract:
An inspection method to be used to inspect an examination system configured to image an object and make a good/defective determination of the object on the basis of an image acquired by the imaging comprises displaying a sample image of the object, imaging the displayed sample image by a camera, and making a good/defective determination of the object indicated by the sample image on, the basis of the image acquired by imaging of the camera.
Public/Granted literature
- US20210279856A1 INSPECTION METHOD OF EXAMINATION SYSTEM AND EXAMINATION SYSTEM Public/Granted day:2021-09-09
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