An electric current measuring arrangement includes: a first control unit including a first microcontroller; a second control unit including: a second microcontroller; an amplifier electrically interconnected between the second microcontroller and terminals of a shunt resistor for current measurement; and a node interconnected between one of the terminals of the shunt resistor and the amplifier; a communication line communicatively connecting the first control unit and the second control unit. The first microcontroller is configured to generate a test pattern signal, and to transmit the test pattern signal to the second control unit through the communication line, the second control unit is configured to transmit the test pattern signal to the node, the second microcontroller is configured to receive a measuring signal through the amplifier, and the first microcontroller is configured to receive the measuring signal, compare the measuring signal with the test pattern signal, and verify the current measurement.