Determining feature impact within machine learning models using prototypes across analytical spaces
Abstract:
Methods, systems, and non-transitory computer readable storage media are disclosed for analyzing feature impact of a machine-learning model using prototypes across analytical spaces. For example, the disclosed system can identify features of data points used to generate outputs via a machine-learning model and then map the features to a feature space and the outputs to a label space. The disclosed system can then utilize an iterative process to determine prototypes from the data points based on distances between the data points in the feature space and the label space. Furthermore, the disclosed system can then use the prototypes to determine the impact of the features within the machine-learning model based on locally sensitive directions; region variability; or mean, range, and variance of features of the prototypes.
Information query
Patent Agency Ranking
0/0