Invention Grant
- Patent Title: Clock data calibration circuit
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Application No.: US17394299Application Date: 2021-08-04
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Publication No.: US11582018B2Publication Date: 2023-02-14
- Inventor: Jing-Zhi Gao , Yu-Hsin Tseng , Yung-Sung Chang , Zhi-Xin Lin
- Applicant: Faraday Technology Corp.
- Applicant Address: TW Hsinchu
- Assignee: Faraday Technology Corp.
- Current Assignee: Faraday Technology Corp.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: TW110113597 20210415
- Main IPC: H04L7/00
- IPC: H04L7/00

Abstract:
A clock data calibration circuit including a first comparator, a multi-phase clock generator, a plurality of samplers, a plurality of data comparators and a data selector is provided. The first comparator compares first input data with second input data to generate a data signal. The multi-phase clock generator generates a plurality of clock signals, and the clock signals are divided into a plurality of clock groups. The sampler samples the data signal according to the clock groups to respectively generate a plurality of first sampled data signal groups. The data comparators respectively sample the first sampled data signal groups according to selected clocks to generate a plurality of second sampled data signal groups. Each data comparator generates a plurality of status flags according to a variation state of a plurality of second sampled data. The data selector generates a plurality of output data signals according to the status flags.
Public/Granted literature
- US20220337385A1 CLOCK DATA CALIBRATION CIRCUIT Public/Granted day:2022-10-20
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