Invention Grant
- Patent Title: Storage device with data quality metric and selectable data recovery scheme
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Application No.: US17207600Application Date: 2021-03-19
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Publication No.: US11593197B2Publication Date: 2023-02-28
- Inventor: Rekha Pitchumani , Zongwang Li
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Renaissance IP Law Group LLP
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G06F11/10 ; G06F11/14 ; G06F11/07

Abstract:
A storage device is disclosed. The storage device may include storage for data. A controller may manage writing the data to the storage and reading the data from the reading storage. A data quality metric table may map a first number of errors to a first data quality metric and map a second number of errors to a second data quality metric. A transmitter may return the data quality metric table to a host.
Public/Granted literature
- US20220197741A1 STORAGE DEVICE WITH DATA QUALITY METRIC AND SELECTABLE DATA RECOVERY SCHEME Public/Granted day:2022-06-23
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