Invention Grant
- Patent Title: Determining confident data samples for machine learning models on unseen data
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Application No.: US16934650Application Date: 2020-07-21
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Publication No.: US11593650B2Publication Date: 2023-02-28
- Inventor: Min Zhang , Gopal B. Avinash , Zili Ma , Kevin H. Leung , Wen Jin
- Applicant: GE Precision Healthcare LLC
- Applicant Address: US WI Milwaukee
- Assignee: GE Precision Healthcare LLC
- Current Assignee: GE Precision Healthcare LLC
- Current Assignee Address: US WI Milwaukee
- Agency: Amin, Turocy & Watson, LLP
- Main IPC: G06N3/04
- IPC: G06N3/04 ; G06N3/08 ; G06F16/28

Abstract:
Techniques are provided for determining confident data samples for machine learning (ML) models on unseen data. In one embodiment, a method is provided that comprises extracting, by a system comprising a processor, a feature vector for a data sample based on projection of the data sample onto a standard feature space. The method further comprises processing, by the system, the feature vector using an outlier detection model to determine whether the data sample is within a scope of a training dataset used to train a machine learning model, wherein the outlier detection model was trained using features extracted from the training dataset based on projection of data samples included in the training dataset onto the standard feature space.
Public/Granted literature
- US20200349434A1 DETERMINING CONFIDENT DATA SAMPLES FOR MACHINE LEARNING MODELS ON UNSEEN DATA Public/Granted day:2020-11-05
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